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Testing of Digital Systems by Gupta, S. Hardback Book The Fast Free Shipping
FREE US DELIVERY | ISBN: 0521773563 | Quality Books
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Specificaties
- Objectstaat
- ISBN
- 0521773563
- EAN
- 9780521773560
- Release Title
- Testing of Digital Systems
- Artist
- Gupta, S.
- Brand
- N/A
- Colour
- N/A
- Book Title
- Testing of Digital Systems
- Subject Area
- Computers
- Publication Name
- Testing of Digital Systems
- Publisher
- Cambridge University Press
- Item Length
- 10.1 in
- Subject
- Computer Engineering
- Publication Year
- 2003
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 1.9 in
- Item Weight
- 77.1 Oz
- Item Width
- 7.1 in
- Number of Pages
- 1016 Pages
Over dit product
Product Identifiers
Publisher
Cambridge University Press
ISBN-10
0521773563
ISBN-13
9780521773560
eBay Product ID (ePID)
1682845
Product Key Features
Number of Pages
1016 Pages
Language
English
Publication Name
Testing of Digital Systems
Subject
Computer Engineering
Publication Year
2003
Type
Textbook
Subject Area
Computers
Format
Hardcover
Dimensions
Item Height
1.9 in
Item Weight
77.1 Oz
Item Length
10.1 in
Item Width
7.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2003-277476
Dewey Edition
21
Illustrated
Yes
Dewey Decimal
621.381548
Table Of Content
1. Introduction; 2. Fault models; 3. Combinational logic and fault simulation; 4. Test generation for combinational circuits; 5. Sequential ATPG; 6. IDDQ testing; 7. Functional testing; 8. Delay fault testing; 9. CMOS testing; 10. Fault diagnosis; 11. Design for testability; 12. Built-in self-test; 13. Synthesis for testability; 14. Memory testing; 15. High-level test synthesis; 16. System-on-a-chip testing; Index.
Synopsis
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference., Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference., The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
LC Classification Number
TK7874.65 .J43 2003
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- a***t (230)- Feedback gegeven door koper.Afgelopen maandGeverifieerde aankoopI ordered this book on Sept 1. After a week, tracking showed it hadn’t been accepted at the USPS. Despite writing customer service multiple times, I had to wait 14 business days to cancel the order. So now at the end of Sept I have no book and they apologized for the “inconvenience.” No attempt to cancel early and send out a new copy. Terrible robot service
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